Silicon Ion Implanted Alpha Detectors SIID

Application

Silicon Ion Implanted Alpha Detectors are designed to enable precise alpha spectroscopy. The thin entrance window of the detectors provides good energy resolution even in close proximity alpha radioactive source providing high efficiency registration of alpha particles.

Features

  • The detectors can operate without hermetization due to location of P-N junction inside of the detector crystal
  • Contacts are formed using ion-implantation method and provide thin, well-formed junctions
  • Relatively thin dead layer (less than 500 Å)
  • High solidity entrance window
  • Can work in vacuum
  • Possibility of annealing the detectors up to 100 °C
  • The detectors may be packed in different kinds of packages with BNC or MICRODOT connectors or wire leads adapted for different customer’s needs
  • The detectors are produced with open window or with metalized window
A special version of the Ion Implanted Silicon Alpha Particle Detectors with metalized coating of entrance window allows the detector to monitor radioactive aerosols. This is special version of the detectors with characteristic features:
  • Allows the detector operation in ambient light
  • The metal coating provides mechanical and chemical protection. The thickness of entrance window is less than 2 μm
  • Can be operated at bias voltage - from +15 to +24 V

DESCRIPTION

Silicon Ion Implanted Alpha Detectors enable precise alpha particle spectroscopy. The thin entrance window of the detectors provides good energy resolution even in close proximity of the alpha radioactive source and also provides high efficiency registration of alpha particles.

SPECIFICATION

Detector area, mm2Alpha energy resolution*, keVBeta energy resolution*, keVDetector typeThickness, μmDetector bias voltage, V
50126Open300 ± 3050-70
100148Open300 ± 3050-70
3001614Open300 ± 3050-70
4502015Open400 +/- 3050-70
4502517Metalized400 +/- 3050-70
6002523Open400 +/- 3050-70
6003020Metalized400 +/- 3024-48
9003020Open400 +/- 3050-70
1200**3530Open400 +/- 3050-70
* Shaping time – 1 µs.
**The detectors of other sizes are available.

FILES TO DOWNLOAD

PDF brochure

FOR ADDITIONAL INFORMATION CONTACT US